Near-field correlative nanoscopy accesses physical constants in complex functional materials

Nanoscale characterization methods play a key role in the analysis, development and optimization of nanoscopic materials and devices. Often several characterization techniques are required to gain a comprehensive understanding of the various material properties of complex functional materials. Here we introduce the combined nanoscale analysis of complex material systems by correlating infrared scattering-type Scanning Near-field Optical Microscopy (s-SNOM) with information obtained by other Scanning Probe Microscopy (SPM) based techniques. For example near-field reflection/absorption imaging at 1500 cm^-1 of a only 50 nm thin phase-separated PS/LDPE polymer film allows to selectively highlight the distribution of PS in the blend, while atomic force microscopy modes simultaneously map the mechanical properties like adhesion. Further, results will be presented that correlate the nanoscale near-field optical response of semiconducting samples like SRAM devices in different frequency ranges (mid-IR & THz) to Kelvin Probe Force Microscopy and Electrostatic Force Microscopy measurements. Thus, neaspec s-SNOM systems represent an ideal platform to characterize complex material systems by different near-field optical and SPM-based mechanical and electrical methods at the nanoscale.