Ultrafast electron dynamics in a thin C60 films observed with time and angle resolved photoemission

C60 derivatives are common acceptor materials for organic solar cells. Time- and angle-resolved photoelectron spectroscopy (tr-ARPES) is a powerful way to study the electron dynamics in these systems. However, experiments on perturbatively excited systems are very demanding. By combining an 88 MHz ultrafast XUV source [1] with time-of-flight momentum microscopy [2], we are able to perform experiments at high speed and low excitation fluence. Here we present first demonstration results on C60 films with this technique.
[1] C. Corder, et al, Structural Dynamics 5, 054301 (2018).
[2] K. Medjanik, et. al, Nature Materials 16, 615 (2017).