Using chip-based calorimetry to monitor crystallization during polymer processing
ORAL
Abstract
Polymer processing often involves rapid changes in temperature and strain, which significantly modify the properties and thus performance. Advancements in chip-based calorimetric techniques overcome temperature scanning rate and instrument response limitations of conventional differential scanning calorimeters, enabling off-line probing of commercially relevant process conditions. In this talk we will describe how we have used commercial, chip-based calorimetric instrumentation to monitor crystallization under process relevant conditions. Using a chip-based calorimeter we can monitor the crystallization of semi-crystalline polyolefins as they move through the pelletization step of the manufacturing process. Mapping time-dependent crystallization covering up to 1000 seconds was possible. Blown film processing, which undergoes cooling at rates approaching 100 ○C/s, could be mimicked using the chip calorimeters. By coupling this data to at-line monitoring schemes, strain-induced crystallization can be deduced.
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Presenters
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Kenneth Kearns
Dow Chemical Company
Authors
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Kenneth Kearns
Dow Chemical Company
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Thomas R Fielitz
Dow Chemical Company
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Rajen M Patel
Dow Chemical Company
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Shrikant Dhodapkar
Dow Chemical Company
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Travis McIntire
Dow Chemical Company
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Jin Wang
Dow Chemical Company
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Christopher M Thurber
Dow Chemical Company
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Robbyn Prange
Dow Chemical Company