Using chip-based calorimetry to monitor crystallization during polymer processing

ORAL

Abstract

Polymer processing often involves rapid changes in temperature and strain, which significantly modify the properties and thus performance. Advancements in chip-based calorimetric techniques overcome temperature scanning rate and instrument response limitations of conventional differential scanning calorimeters, enabling off-line probing of commercially relevant process conditions. In this talk we will describe how we have used commercial, chip-based calorimetric instrumentation to monitor crystallization under process relevant conditions. Using a chip-based calorimeter we can monitor the crystallization of semi-crystalline polyolefins as they move through the pelletization step of the manufacturing process. Mapping time-dependent crystallization covering up to 1000 seconds was possible. Blown film processing, which undergoes cooling at rates approaching 100 C/s, could be mimicked using the chip calorimeters. By coupling this data to at-line monitoring schemes, strain-induced crystallization can be deduced.

Presenters

  • Kenneth Kearns

    Dow Chemical Company

Authors

  • Kenneth Kearns

    Dow Chemical Company

  • Thomas R Fielitz

    Dow Chemical Company

  • Rajen M Patel

    Dow Chemical Company

  • Shrikant Dhodapkar

    Dow Chemical Company

  • Travis McIntire

    Dow Chemical Company

  • Jin Wang

    Dow Chemical Company

  • Christopher M Thurber

    Dow Chemical Company

  • Robbyn Prange

    Dow Chemical Company