Visualization of Polymer Crystallization by a Combination of Atomic Force Microscopy with Fast Scanning Calorimetry

ORAL

Abstract

Abstract: The chip-sensor of fast scanning calorimetry (FSC) is directly mounted on the scanner of an atomic force microscope (AFM). By combining AFM with FSC (AFM-FSC) this way, AFM can illustrate the crystal structures on the nanoscale, as well as, FSC can treat the sample at any annealing temperature without unexcepted crystallization during heating or cooling at scanning rates up to 1,000,000 K/s. First results on crystals’ morphologies, spherulites’ growth rates and the influence of crystal nuclei by Tammann’s two stage method are shown.
Keywords: Fast Scanning Calorimetry, Atomic Force Microscopy, Morphology, Crystal Growth, Tammann’s method

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Presenters

  • Rui Zhang

    Institute of Physics, University of Rostock

Authors

  • Rui Zhang

    Institute of Physics, University of Rostock

  • Evgeny Zhuravlev

    Institute of Physics, University of Rostock, University of Rostock

  • Christoph Schick

    Institute of Physics, University of Rostock, University of Rostock