"Coherent Illumination-Direction-Multiplexing Dual-Space and Fourier Ptychographic Microscopy"

We present a variation of the Fourier ptychographic microscopy (FPM) algorithm adapted for imaging samples simultaneously illuminated by multiple beams coherent with each other. The modified algorithm was successfully tested using the light diffracted by a Ronchi-ruling as the source of illumination. We describe proof-of concept experiments demonstrating, first, that the presented method permits to recover the structure of the sample from a set of low-resolution RP images containing not the images of the sample, but Moiré patterns carrying information about the structure of the sample. Second, we demonstrate the capability of the presented method for obtaining images of the sample with a resolution better than the Rayleigh resolution limit.

References:
G. Zheng, R. Horstmeyer, and C. Yang, “Wide-field, high-resolution Fourier ptychographic microscopy,” Nat. Photonics 7, 739–745 (2013).
M. Alotaibi, S. Skinner-Ramos, A. Alamri, B. Alharbi, M. Alfarraj, and L. Grave de Peralta, “Illumination direction multiplexing Fourier ptychographic microscopy using hemispherical digital condensers,” Appl. Opt. 56, 4052-4057 (2017).