A Novel Method for Thermal Conductivity Measurements in Atomically Thin Materials

Study of thermal properties of materials are crucial for applications and fundamental science. There are many techniques available in the literature to measure thermal conductivity. Measuring the thermal conductivity of atomically thin materials however, is a major challange. The most common method is to measure the temperature calibrated shift of a well-defined Raman peak with increasing laser power over a suspended sample.The a fit to the measured data with a temperature profile yields the thermal conductivity. Applicability of this method is limited to materials with relatively low thermal conductivity and well established Raman peaks. In this presentation, I will talk about the method we developed for measuring the thermal resistivity of atomically thin materials relies on a laser beam and two terminal resistivity measurement. The technique can be applied to any conductive material.