Atomically Resolved Probe-type Scanning Tunneling Microscope for Use in Harsh Vibrational Cryogen-free Superconducting Magnet

POSTER

Abstract

We present a probe-type scanning tunneling microscope (STM) with atomic resolution that is designed to be directly inserted and work in a harsh vibrational cryogen-free superconducting magnet system. When a commercial variable temperature insert (VTI) is installed in the magnet and the STM is in turn housed in the VTI, a lowest temperature of 1.6 K can be achieved, where the STM still operates well. We have tested it in an 8 T superconducting magnet cooled with the pulse-tube cryocooler (PTC) and obtained atomically revolved graphite and NiSe2images as well as the scanning tunneling spectrum (STS, i.e. dI/dV spectrum) data of the latter near its critical temperature, which show the formation process of the superconducting gap as a function of temperature. The drifting rates of the STM at 1.6 K in X-Y plane and Z direction are 1.15 and 1.71 pm/min respectively.This is important as a cryogen-free magnet system has long been considered too harsh for any atomic resolution measurement.

Presenters

  • Wenjie Meng

    Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High magnetic filed laboratary of the Chinese Academy of Sciences, Anhui Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory and Hefei Science Center, Chinese Academy of Sciences

Authors

  • Wenjie Meng

    Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High magnetic filed laboratary of the Chinese Academy of Sciences, Anhui Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory and Hefei Science Center, Chinese Academy of Sciences

  • Jihao Wang

    Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High magnetic filed laboratary of the Chinese Academy of Sciences, Anhui Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory and Hefei Science Center, Chinese Academy of Sciences

  • Yubin Hou

    Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High magnetic filed laboratary of the Chinese Academy of Sciences, Anhui Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory and Hefei Science Center, Chinese Academy of Sciences

  • Mengqiao Sui

    Oxford Instruments Technology (Shanghai) Co., Ltd

  • Junting Wang

    Anhui Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory and Hefei Science Center, Chinese Academy of Sciences

  • Gang Wu

    Oxford Instruments Technology (Shanghai) Co., Ltd

  • Jing Zhang

    Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High magnetic filed laboratary of the Chinese Academy of Sciences, Anhui Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory and Hefei Science Center, Chinese Academy of Sciences

  • Junyun Li

    Oxford Instruments Technology (Shanghai) Co., Ltd

  • Qingyou Lu

    Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High magnetic filed laboratary of the Chinese Academy of Sciences, Anhui Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory and Hefei Science Center, Chinese Academy of Sciences, University of Science and Technology of China