Achieving µeV resolution in scanning tunneling spectroscopy at mK temperatures in Al-Al SIS junctions
ORAL
Abstract
[1] Song et al., RSI 81, 121101 (2010)
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Presenters
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Johannes Schwenk
National Institute of Standards and Technology, Physical Measurement Laboratory, National Institute of Standards and Technology
Authors
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Johannes Schwenk
National Institute of Standards and Technology, Physical Measurement Laboratory, National Institute of Standards and Technology
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Sungmin Kim
National Institute of Standards and Technology, Physical Measurement Laboratory, National Institute of Standards and Technology
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Julian Berwanger
Institut für Experimentelle und Angewandte Physik, Universität Regensburg
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William G Cullen
National Institute of Standards and Technology, Physical Measurement Laboratory, National Institute of Standards and Technology
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Steven R Blankenship
National Institute of Standards and Technology
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Young Kuk
Center for Quantum Nanoscience, Ewha Womans University, Seoul, Korea, Center for Quantum Nanoscience, Institute of Basic Science, Ewha Womans University, Seoul, Korea, Seoul National University, Department of Physics and Astronomy, Seoul National University
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Franz J Giessibl
Institut für Experimentelle und Angewandte Physik, Universität Regensburg
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Joseph A Stroscio
National Institute of Standards and Technology, Physical Measurement Laboratory, National Institute of Standards and Technology, National Institute of Standards and Technology (NIST)