Magneto-electrical signatures of spin dependent processes in organic semiconductors
ORAL
Abstract
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Presenters
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Sebastian Engmann
Nanoscale Device Characterization Division, National Institute of Standards and Technology
Authors
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Sebastian Engmann
Nanoscale Device Characterization Division, National Institute of Standards and Technology
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Adam Barito
Nanoscale Device Characterization Division, National Institute of Standards and Technology
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Emily Geraldine Bittle
Nanoscale Device Characterization Division, National Institute of Standards and Technology, National Institute of Standards and Technology
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Lee Richter
Materials Science and Engineering Division, National Institute of Standards and Technology
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Noel C Giebink
Electrical Engineering, The Pennsylvania State University
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David James Gundlach
Nanoscale Device Characterization Division, National Institute of Standards and Technology, National Institute of Standards and Technology