Microscopy 1: Electrons, THz, Optical

FOCUS · Q31 · ID: 48276

Presentations

  • Mapping conductivity with secondary electron EBIC in a STEM

    ORAL

    –

    Publication: O. Dyck, J. L. Swett, A. R. Lupini, J. A. Mol, and S. Jesse, "Imaging Secondary Electron Emission from a Single Atomic Layer," Small Methods, vol. 5, no. 4, p. 2000950, 2021, doi: 10.1002/smtd.202000950.
    O. Dyck, J. L. Swett, C. Evangeli, A. R. Lupini, J. A. Mol, and S. Jesse, Mapping Conductance and Switching Behavior of Graphene Devices In Situ, Small Methods (under review)
    O. Dyck, J. L. Swett, C. Evangeli, A. R. Lupini, J. A. Mol, and S. Jesse, Contrast mechanisms in secondary electron e-beam induced current (SEEBIC) imaging, (in progress)

    Presenters

    • Ondrej Dyck

      ORNL, Oak Ridge National Laboratory, Oak Ridge National Lab

    Authors

    • Ondrej Dyck

      ORNL, Oak Ridge National Laboratory, Oak Ridge National Lab

    • Jacob Swett

      ASU, Arizona State University

    • Charalambos Evangeli

      Oxford University

    • Andrew R Lupini

      Oak Ridge National Lab

    • Jan Mol

      Queen Mary University of London

    • Stephen Jesse

      Oak Ridge National Laboratory, University of Tennessee

    View abstract →

  • Enhancing Symmetry Breaking Defects in Materials with a STEM Phase Plate

    ORAL

    –

    Presenters

    • Stephanie M Ribet

      Department of Materials Science and Engineering, Northwestern University; International Institute of Nanotechnology, Northwestern University, Northwestern University

    Authors

    • Stephanie M Ribet

      Department of Materials Science and Engineering, Northwestern University; International Institute of Nanotechnology, Northwestern University, Northwestern University

    • Colin L Ophus

      National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Lawrence Berkeley National Laboratory

    • Vinayak P Dravid

      Northwestern University, Department of Materials Science and Engineering, Northwestern University; International Institute of Nanotechnology, Northwestern University; NUANCE Center, Northwestern U.

    • Roberto dos Reis

      Department of Materials Science and Engineering, Northwestern University; NUANCE Center, Northwestern University, Northwestern University

    View abstract →

  • Kinetic and thermodynamic measurements of the crystallization of phase change materials using transmission electron microscopy and nanocalorimetry

    ORAL

    –

    Publication: Isak McGieson, Victoriea L. Bird, Christopher M. Barr, Khalid Hattar, Bryan W. Reed, Joseph T. McKeown, Feng Yi, David A. LaVan, and M. K. Santala.
    "Crystallization kinetics and thermodynamics of an Ag-In-Sb-Te phase change material using complementary in-situ microscopic techniques".
    In: Journal of Materials Research (2021). submitted invited paper.

    Presenters

    • Isak McGieson

      Oregon State University

    Authors

    • Isak McGieson

      Oregon State University

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  • Atomic scale direct-write dopant patterning on graphene

    ORAL

    –

    Presenters

    • Andrew R Lupini

      Oak Ridge National Lab

    Authors

    • Andrew R Lupini

      Oak Ridge National Lab

    • Ondrej Dyck

      ORNL, Oak Ridge National Laboratory, Oak Ridge National Lab

    • Mina Yoon

      Oak Ridge National Lab

    • Sergei V Kalinin

      Oak Ridge National Lab, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge National Laboratory

    • Jacob Swett

      ASU, Arizona State University

    • Stephen Jesse

      Oak Ridge National Laboratory, University of Tennessee

    View abstract →

  • Traceable localization in optical microscopy

    ORAL

    –

    Publication: arXiv:2106.10221

    Presenters

    • Craig R Copeland

      NIST, National Institute of Standards and Technology

    Authors

    • Craig R Copeland

      NIST, National Institute of Standards and Technology

    • Ronald G Dixson

      National Institute of Standards and Technology

    • Andrew C Madison

      National Institute of Standards and Tech

    • Adam L Pintar

      National Institute of Standards and Technology

    • B. Rob Ilic

      National Institute of Standards and Technology

    • Samuel M Stavis

      National Institute of Standards and Technology

    View abstract →

  • Rapid simulations of hyperspectral near-field images of three-dimensional heterogeneous surfaces

    ORAL

    –

    Publication: Chen, Xinzhong, et al. "Rapid simulations of hyperspectral near-field images of three-dimensional heterogeneous surfaces." accepted by Opt. Express

    Presenters

    • Ziheng Yao

      State Univ of NY - Stony Brook, Stony Brook University (SUNY)

    Authors

    • Xinzhong Chen

      Stony Brook University (SUNY), State Univ of NY - Stony Brook

    • Ziheng Yao

      State Univ of NY - Stony Brook, Stony Brook University (SUNY)

    • Stefan G Stanciu

      Politehnica University of Bucharest

    • Dmitri N Basov

      Columbia University

    • Rainer Hillenbrand

      CIC nanoGUNE

    • Mengkun Liu

      State Univ of NY - Stony Brook

    View abstract →

  • Development of Image Corrections for Photoemission Electron Microscopy (PEEM) and its Application to Graphene

    ORAL

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    Publication: "Imaging and Measuring the Electronic Properties of Epitaxial Graphene with a Photoemission Electron Microscopy"
    by Falk Niefind, Henry Bell, Thuc Mai, Angela Hight Walker, Randolph Elmquist, and Sujitra Pookpanratana (under review)

    Presenters

    • Henry Bell

      National Institute of Standards and Technology and University of Maryland, National Institute of Standards and Technology and Macalester College

    Authors

    • Henry Bell

      National Institute of Standards and Technology and University of Maryland, National Institute of Standards and Technology and Macalester College

    • Falk Niefind

      National Institute of Standards and Technology and University of Maryland, National Institute of Standards and Technology and University of Maryland College Park

    • Randolph E Elmquist

      National Institute of Standards and Technology

    • Sujitra Pookpanratana

      National Institute of Standards and Tech

    View abstract →

  • Reconstruction of Nano-Plasmonic Excitations Using Ultrafast Transmission Electron Microscopy

    ORAL

    –

    Presenters

    • John H Gaida

      Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany

    Authors

    • John H Gaida

      Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany

    • Hugo Lourenço-Martins

      Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany

    • Sergey Yalunin

      Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany

    • Armin Feist

      Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany

    • Murat Sivis

      Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany

    • Thorsten Hohage

      Institute of Numerical and Applied Mathematics, University of Göttingen, 37083 Göttingen, Germany

    • F. Javier García de Abajo

      ICFO-Institut de Ciencies Fotoniques and ICREA-Institució Catalana de Recerca i Estudis Avançats, Barcelona, Spain

    • Claus Ropers

      Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany

    View abstract →

  • A scanning NV center magnetometry probe fabricated by a focused ion beam

    ORAL

    –

    Presenters

    • Yuta Kainuma

      Japan Advanced Institute of Science and Technology

    Authors

    • Yuta Kainuma

      Japan Advanced Institute of Science and Technology

    • Aoi Ideguchi

      Japan Advanced Institute of Science and Technology

    • Kunitaka Hayashi

      Japan Advanced Institute of Science and Technology

    • Toshu An

      Japan Advanced Institute of Science and Technology

    View abstract →