Atomically flat epitaxial Cr2O3 films on atomically flat Pd electrodes for magnetoelectric and topological applications.

ORAL

Abstract

Cr2O3 is one of the best magnetoelectric antiferromagnetic materials and is also an excellent substrate for many hexagonal topological materials. To fully utilize these functionalities, it is essential to have epitaxial pin-hole-free Cr2O3 films on conducting electrodes. So far, V2O3 has been identified as the best conducting bottom electrode for epitaxial Cr2O3 due to their matching crystal structures. However, V2O3 is a poor conductor at room temperature and becomes insulating at low temperatures, so its utility is very limited.

Here, we demonstrate atomically flat epitaxial Cr2O3 films with excellent electronic properties on highly conducting Pd films grown on Al2O3 (0001) substrates. It turns out that achieving epitaxial and atomically flat Pd film is critical to grow the high quality Cr2O3 films. Along the way, we have found that growth of epitaxial Pd film on sapphire substrate is highly challenging despite their excellent lattice match because Pd film has a strong tendency to ball up on sapphire. However, with a new growth recipe, we were able to convert the morphology of epitaxial Pd film from discontinuous, microscopic islands to contiguous, atomically flat regime. The availability of epitaxial Cr2O3 films on metallic electrodes will open many new opportunities for both magnetoelectric and topological applications.

* This work is supported by Army Research Office’s W911NF2010108, Army Research Office’s W911NF2020166.

Presenters

  • Xiaoyu Yuan

    Rutgers University

Authors

  • Xiaoyu Yuan

    Rutgers University

  • Debarghya Mallick

    Rutgers University

  • Seongshik Oh

    Rutgers University