Understanding Loss Mechanisms in InAs-based Gatemon Qubits
ORAL
Abstract
Gate tunable Josephson-Junction (JJ) devices on InAs, offer a promising avenue for implementation of voltage-controlled superconducting qubits. Preliminary results demonstrate notable tunability >1GHz in gatemon qubits, however they suffer from a multitude of loss mechanisms. Specific candidates include kinetic inductive losses in the resonators, radiative gate loss, dielectric loss, and junction loss. We present a strategy to quantify various mechanisms that manifest in resonator quality factors. We find that for thin Al, kinetic inductance based losses dominate. For thicker Al, losses are dominated by dielectric loss in the blanket ald layer, and the InP substrate.
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Publication: Characterizing losses in InAs two-dimensional electron gas-based gatemon qubits
Presenters
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Lukas J Baker
New York University (NYU)
Authors
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Lukas J Baker
New York University (NYU)
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William Strickland
New York University
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Krishna Dindal
NYU, New York University (NYU), New York University
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Jaewoo Lee
NYU, New York University (NYU), New York University
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Javad Shabani
New York University
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Bassel H Heiba Elfekey
New York University (NYU), New York University, New York Univeristy
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Jacob Issokson
NYU, New York University (NYU), New York University
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Jacob Issokson
NYU, New York University (NYU), New York University
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Ido Levy
New York University