AFM Nanomechanics for Polymer Physics

ORAL · Invited

Abstract

Atomic force microscope (AFM)-based nano-mechanics [1] is a powerful tool to investigate a wide variety of topics in polymer science and technology, which gives maps of Young's mod-ulus, adhesion etc. at nano-scale resolution. In this presentation, some selected topics will be reviewed, which include: Heterogeneous stress formation of filled rubber materials upon mechanical stimuli [2]; Visualization of dynamic stress network formed in block-copolymer based thermoplastic elastomers [3]; Sub-surface information detected by AFM nanomechanics and its validation with transmission electron tomography (TEMT) [4]; State-of-the-art techniques such as nano-scale viscoelastic measurement based on AFM [5].

* These works were supported by JST CREST Grant Number JPMJCR17J4, JST-Mirai Program grant number JPMJMI18A2, JSPS KAKENHI Grant Numbers 19H02771.

Publication: 1. K. Nakajima, M. Ito, D. Wang, H. Liu, H. K. Nguyen, X. Liang, A. Kumagai, S. Fujinami, Microscopy, 63, 193 (2014).
2. X. Liang, T. Kojima, M. Ito, N. Amino, H. Liu, M. Koishi, K. Nakajima, ACS Appl. Mater. Interfaces, 15, 12414 (2023).
3. H. Liu, X. Liang, K. Nakajima, J. Polym. Sci., 60, 3134 (2022).
4. M. Ito, H. Liu, A. Kumagai, X. Liang, K. Nakajima, H. Jinnai, Langmuir, 38, 777 (2021).
5. E. Ueda, X. Liang, M. Ito, K. Nakajima, Macromolecules, 52, 311 (2019).

Presenters

  • Ken Nakajima

    Tokyo Institute of Technology, Tokyo

Authors

  • Ken Nakajima

    Tokyo Institute of Technology, Tokyo