Scalable randomized benchmarking with mid-circuit measurements

To date, there exists no efficient method for holistically assessing the performance of mid-circuit measurements (MCMs) performed in parallel with quantum gates, despite their importance to fault-tolerant schemes. We correct this by introducing the first randomized benchmarking (RB) protocol for benchmarking circuit layers with MCMs. Our scalable protocol modifies binary randomized benchmarking, a motion reversal-free RB protocol, to naturally benchmark mixed layers of Clifford gates and MCMs. In our talk, we will provide a detailed overview of the protocol before arguing that our protocol measures an average error rate of mixed circuit layers of Clifford gates and MCMs.