Scalable Randomized Benchmarking with Mid-Circuit Measurements, Part 2

Mid-circuit measurements (MCMs) are a key primitive for quantum error correction, but there are currently no scalable benchmarking protocols that holistically assess the performance of gates and mid-circuit measurements. Here, we introduce a fully scalable randomized benchmarking (RB) protocol for Clifford gates and mid-circuit measurements. Our protocol is an adaptation of binary RB, a streamlined RB protocol that does not use motion reversal circuits, enabling inclusion of MCMs.

In this talk, we demonstrate how to use our protocol to reliably measure gate and MCM performance. We present the results of running our protocol on current quantum processors and show how to use these results to extract details of MCM performance. Furthermore, we discuss how our protocol can be adapted to assess mid-circuit measurement structures that are commonly used in quantum error correction, such as parity measurements.