Experimental characterization of error budgeting of parametric resonance gate with tunable coupler

We study the experimental error budget of parametric resonance gates with a floating tunable coupler. We characterized different error sources including, incoherent, leakage, amplitude, and phase errors by varying the two-qubit gate time. We measured the coherence times of qubits under gate operating conditions, and benchmarked leakage using leakage randomized benchmarking. We show that incoherent errors are the limiting factors to the two-qubit gate fidelity for gates longer than 100 ns, predominantly due to 1/f flux noise. As we decrease the two-qubit gate time, leakage to non computational states start to contribute to the limitation of the fidelity.