Scanning SQUID microscopy on van der Waals devices with in situ uniaxial strain

ORAL

Abstract

Van der Waals (vdW) materials, such as graphene and transition metal dichalcogenides, are atomically-thin, crystalline materials that exhibit a rich variety of electronic phenomena. Application of uniaxial strain can be a powerful tool to alter the properties of materials by breaking symmetry and modulating electronic structure. Scanning superconducting quantum interference device (SQUID) microcopy probes local magnetization, electronic transport and magnetic response, which can give insights into the electronic phenomena observed in vdW materials. In this talk, we report on local magnetic measurements using a scanning SQUID on uniaxially strained vdW samples. We fabricate vdW devices on a polyimide substrate, and use a commercial piezoelectric strain cell to apply in-situ tunable strain to the device. We present the design of our straining platform and discuss measurements on few layer NbSe2 samples, where we locally observe changes in the superconducting transition temperature as a function of strain. Our approach is compatible with a wide variety of vdW heterostructures.

* This work was supported by the Cornell Center for Materials Research with funding from the NSF MRSEC program (DMR-1719875). This work was performed in part at the Cornell NanoScale Facility, an NNCI member supported by NSF Grant NNCI-2025233.

Presenters

  • Ruiheng Bai

    Cornell University

Authors

  • Ruiheng Bai

    Cornell University

  • Kaifei Kang

    Cornell University

  • Brian T Schaefer

    Cornell University

  • Kin Fai Mak

    Cornell University

  • Jie Shan

    Cornell University

  • Katja C Nowack

    Cornell University