Contactless electronic compressibility measurements of few-layer WSe2
ORAL
Abstract
* This work is supported by the Basic Energy Sciences Program of the Office of Science of the U.S. Department of Energy through contract no. FG02-08ER46514. S.A. is partially supported by NSF Graduate Research Fellowship Program via grant no. 1122374
–
Presenters
-
Samuel H Aronson
Massachusetts Institute of Technology, Massachusetts Institute of Technology MI
Authors
-
Samuel H Aronson
Massachusetts Institute of Technology, Massachusetts Institute of Technology MI
-
Jackson P Butler
Massachusetts Institute of Technology
-
Madisen A Holbrook
Columbia University
-
Luke N Holtzman
Columbia University
-
Kenji Watanabe
National Institute for Materials Science, NIMS, Research Center for Electronic and Optical Materials, National Institute for Materials Science, Research Center for Functional Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan, National Institute for Material Science
-
Takashi Taniguchi
Kyoto Univ, National Institute for Materials Science, Research Center for Materials Nanoarchitectonics, Research Center for Materials Nanoarchitectonics, National Institute for Materials Science, National Institute for Materials Sciences, NIMS, International Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan, National Institute for Material Science, International Center for Materials Nanoarchitectonics, NIMS, Japan, International Center for Materials Nanoarchitectonics, Tsukuba, National Institue for Materials Science, Kyoto University, National Institute of Materials Science, International Center for Materials Nanoarchitectonics and National Institute for Materials Science
-
Katayun Barmak
Columbia Univ, Columbia University
-
James C Hone
Columbia University
-
Raymond C Ashoori
Massachusetts Institute of Technology, Massachusetts Institute of Technology MIT