Measuring the Localized Physical Properties of A. nidulans Using Atomic Force Microscopy

Mycelial Materials, materials composed of fungi, have been produced with a variety of mechanical properties allowing them to be tailored for specific applications. One clear advantage of these materials is their biodegradability and potential to reduce environmental impacts. The properties of the bulk mycelial material depend significantly on the properties of the individual fungal hyphae. In this work, the localized physical properties measurements of Aspergillus nidulans using Atomic Force Microscopy techniques were measured. Elastic Modulus and adhesion properties were correlated with fungal hyphae topography on a control strain and compared with those of genetically modified mutant strains. The application of this data to optimizing the properties of bulk materials will be discussed.