Probing Transverse Electron Transport in Few-Layer Graphene: Experimental Insights and Quantum Modeling

Measurements of transverse electron transport in few-layer graphene (FLG) samples were carried out using conductive atomic force microscopy (C-AFM). FLG samples of controlled geometry were prepared using a novel method of exfoliation that does not require the use of polymeric adhesives. These samples were subsequently cut to the desired size using the AFM probe. By performing measurements on samples of various sizes, the transverse resistivity of FLG is determined. A compressive force is then applied to the samples using the AFM probe to decrease the interlayer separation distance and modify transverse conductivity. These results are compared to a quantum electron transport model.

This work demonstrates the tunable nature of FLG conductivity through the manipulation of the interlayer distance. The comparison between the experimental data and model offers insight into electron tunneling at elevated temperatures. The combined theoretical and experimental approach contributes to the overall understanding of electron transport in two dimensional and layered materials.