Determining the out-of-plane sound speed in GeS by time-resolved broadband transient reflectivity

POSTER

Abstract

Over the past decade, 2D semiconducting materials, with their distinctive structure and unique physicochemical properties, have drawn attention for potential applications in photonics and optoelectronics. Germanium sulfide (GeS) is a 2D anisotropic semiconductor with a 1.65 eV indirect bandgap. This study will present and explain time-resolved broadband transient reflectivity measurements in a single GeS crystal. Femtosecond (fs) stimulated Brillouin scattering, combined with fs-broadband probe measurements, has been utilized to evaluate the out-of-plane sound speed 3297 ± 100 m/s, in a single GeS crystal. The reported results demonstrate the strength of this non-destructive, all-optical technique for studying elastic properties in frail two-dimensional layer materials, such as semiconductors from the group-14 transition metal monochalcogenides.

* Funding for this research was provided by the King Fahd University of Petroleum and Minerals under the International Scholarly Program Research Grant # ISP221-PHYS-765. W. Al-Basheer is grateful to Prof. Sciaini of the University of Waterloo for hosting, supervising, and providing needed resources.

Presenters

  • Watheq A Al-Basheer

    King Fahd University of Petroleum and Minerals

Authors

  • Watheq A Al-Basheer

    King Fahd University of Petroleum and Minerals

  • Christian Viernes

    The Ultrafast electron Imaging Lab, Department of Chemistry, and Waterloo Institute for Nanotechnology, University of Waterloo, Waterloo, N2L 3G1, Canada

  • Meixin Cheng

    The Ultrafast electron Imaging Lab, Department of Chemistry, and Waterloo Institute for Nanotechnology, University of Waterloo, Waterloo, N2L 3G1, Canada

  • Ruofei Zheng

    The Ultrafast electron Imaging Lab, Department of Chemistry, and Waterloo Institute for Nanotechnology, University of Waterloo, Waterloo, N2L 3G1, Canada

  • Sam Netzke

    The Ultrafast electron Imaging Lab, Department of Chemistry, and Waterloo Institute for Nanotechnology, University of Waterloo, Waterloo, N2L 3G1, Canada

  • Kostyantyn Pichugin

    The Ultrafast electron Imaging Lab, Department of Chemistry, and Waterloo Institute for Nanotechnology, University of Waterloo, Waterloo, N2L 3G1, Canada

  • German Sciaini

    The Ultrafast electron Imaging Lab, Department of Chemistry, and Waterloo Institute for Nanotechnology, University of Waterloo, Waterloo, N2L 3G1, Canada