Variational quantum metrology for multiparameter estimation under noise

ORAL

Abstract

We introduce a hybrid quantum-classical variational approach designed to elevate precision in quantum metrology. In the scheme, both the initial state and the measurement basis in the quantum part are parameterized and optimized via the classical part. This integrated approach facilitates the maximization of information acquired regarding the measured quantity. We explore its practical applications in the context of 3D magnetic field sensing, accounting for various dephasing noise scenarios. Our results showcase its capacity to simultaneously estimate all relevant parameters, surpassing the constraints of the standard quantum limit. This innovation emerges as a robust and invaluable tool for a wide range of metrological applications.

* This work is supported by JSPS KAKENHI Grant Number 23K13025.

Presenters

  • Bin Ho Le

    Tohoku University

Authors

  • Bin Ho Le

    Tohoku University

  • Trung Kien Le

    University of California

  • Hung Q. Nguyen

    Vietnam National University