Insturment for multiplex imaging experiments and diffraction imaging using self-seeded X-rays

Variety X-ray techniques are utilized to investigate the specimens in various fields. In general, scattering and absorption processes arise from the X-ray interaction with matter. Output signals from these processes contain structural information and electronic structure of specimens, respectively. Investigation using complementary X-ray techniques improve the understanding of the complex system in a holistic way. Here, we introduce a multiplex imaging instrument, which can collect small/wide-angle X-ray diffraction and X-ray emission spectrum simultaneously to examine morphological information with nanoscale resolution, crystal arrangement at the atomic scale and electronic structure of the specimens. We also show the benefit when we carry out coherent diffraction imaging using self-seeded X-rays.