Universal structural dependence of optical properties in 3D nanocolumnar metamaterial platforms

POSTER

Abstract

Due to the complexity of optical anisotropy possessed by highly porous nanostructure systems, performing the growth-time dependent critical dimension analysis and unraveling the correlation between the optical and structural parameters remain challenging. With this study, we presented and discussed a route to extract a set of optical parameters, depolarization factors, that are extremely sensitive to the changes in critical dimensions of the nanostructure platforms. We pursue a comprehensive methodical series of studies to investigate the effect of column-aspect-ratio on the evolution of anisotropic homogenization parameters of slanted columnar thin films (SCTFs) from wide range of material choices. Hence, we fabricated sets of highly porous, spatially coherent SCTFs from zirconia (ultra-wide band gap), silicon (semiconductor), titanium (zero-band gap), and permalloy (metal alloy) on silicon substrates by using custom-built, ultra-high vacuum glancing-angle deposition technique. Subsequently, we used the anisotropic Bruggeman effective medium approximation to analyze spectroscopic ellipsometry data. We have successfully extracted the anisotropic optical characteristics, including the complex dielectric function, birefringence, and dichroism, for each metamaterial platform.

* The authors acknowledge partial support by the National ScienceFoundation (NSF) Established Program to Stimulate CompetitiveResearch (EPSCoR) under grant number NSF OIA-2044049. This workwas also partially supported by the NSF under award numbers DMR2224456 and 1808715, Air Force Office of Scientific Research underaward number FA9550-18-1-0360, Swedish Knut and Alice WallenbergsFoundation supporting grant titled 'Wide-bandgap semi-conductors fornext generation quantum components', and American ChemicalSociety/Petrol Research Fund, and the Office of Naval Research YoungInvestigator Program (ONR YIP) under award number N00014-19-1-2384,the University of Nebraska Foundation and the J. A. Woollam Foundationfor financial support.

Presenters

  • Ufuk Kilic

    University of Nebraska - Lincoln, University of Nebraska-Lincoln

Authors

  • Ufuk Kilic

    University of Nebraska - Lincoln, University of Nebraska-Lincoln

  • Yousra Traouli

    University of Nebraska - Lincoln

  • Matthew Hilfiker

    Onto Innovation Inc.

  • Khalil Bryant

    University of Nebraska-Lincoln

  • Stefan Schoeche

    J.A. Woollam Co.

  • Rene Feder

    Fraunhofer Institute for Microstructure of Materials and Systems (IMWS), Fraunhofer Institute for Microstructure of Materials and Systems

  • Christos Argyropoulos

    The Pennsylvania State University, University of Nebraska - Lincoln

  • Eva Schubert

    University of Nebraska - Lincoln, University of Nebraska-Lincoln

  • Mathias M Schubert

    University of Nebraska - Lincoln