Improving equivalent circuit models of interdigitated capacitors
ORAL
Abstract
Interdigitated capacitors are nearly ubiquitous circuits found in everything from telecommunications components to superconducting quantum computers. When the guided wavelength becomes comparable to the length of the interdigitation in the capacitor, common lumped-element models fail to describe how the impedance changes as a function of frequency. This failure limits the frequency range where one can accurately predict the performance of interdigitated capacitors and extract material properties. Here, we develop a multi-mode distributed theory for interdigitated capacitors and quantify the trade-offs between a lumped-element and distributed approach. To test our model, we measured interdigitated capacitors fabricated on (LaAlO3)0.3(Sr2TaAlO6)0.7 substrate and interdigitated capacitors with same geometry fabricated on a BaSrTiO3 thin film.
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Presenters
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Nicholas R Jungwirth
National Institute of Standards and Technology
Authors
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Nicholas R Jungwirth
National Institute of Standards and Technology
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Eric Marksz
Northrop Grumman
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Aaron Hagerstrom
National Institute of Standards and Technology
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Ichiro Takeuchi
University of Maryland
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Nate Orloff
National Institute of Standards and Technology