Superfluid stiffness of twisted multilayer graphene: Part-1

ORAL

Abstract

Superfluid stiffness measurements offer a powerful probe of the superconducting state and a primary means to characterize their pairing symmetries. While penetration depth experiments can be used in bulk materials to extract superfluid stiffness, for two-dimensional materials with a small sample volume, alternative methods are required. Here we discuss the development of a technique to measure the superconducting kinetic inductance in low-dimensional materials and apply it to twisted multilayer graphene. We investigate superfluid stiffness as a function of carrier density and temperature and provide interpretations for possible pairing symmetries.

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Presenters

  • Abhishek Banerjee

    Harvard University

Authors

  • Abhishek Banerjee

    Harvard University

  • Zeyu Hao

    Harvard University

  • Mary Kreidel

    Harvard University

  • Isabelle Y Phinney

    Harvard University

  • Jeong Min Park

    Massachusetts Institute of Technology

  • Patrick Ledwith

    Harvard University, Harvard university

  • Andrew Zimmerman

    Harvard University

  • Robert M Westervelt

    Harvard University

  • Pablo Jarillo-Herrero

    Massachusetts Institute of Technology MI, Massachusetts Institute of Technology MIT, Massachusetts Institute of Technology

  • Pavel A Volkov

    University of Connecticut

  • Ashvin Vishwanath

    Harvard University

  • Kin Chung Fong

    Raytheon BBN Technologies, Raytheon BBN, BBN Raytheon

  • Philip Kim

    Harvard University