Silicon nitride crystallization study via molecular dynamics and the Ultra-Fast 3-body (UF3) machine-learned interatomic potential
ORAL
Abstract
Amorphous silicon nitride (SiN) is an insulating layer material in microelectronics devices which acts as an ion diffusion barrier. Under high-temperature (>1300K) annealing conditions, experiments have demonstrated unexpected crystallization to alpha Si3N4. We employ molecular dynamics (MD) methods to understand the primary drivers for this crystal growth phenomenon using the Ultra-Fast 3-body (UF3) machine-learned interatomic potential. UF3 is an accurate, efficient, and interpretable potential framework for training from quantum calculations. We present an analysis of amorphous silicon nitride structure and dynamic properties of the amorphous to crystalline transition. These results are compared and contrasted with several established empirical interatomic potentials, as well as with experimental measurements. Sandia National Laboratories is a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia LLC, a wholly owned subsidiary of Honeywell International Inc. for the U.S. Department of Energy’s National Nuclear Security Administration under contract DE-NA0003525
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Presenters
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Tesia D Janicki
Sandia National Laboratories
Authors
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Tesia D Janicki
Sandia National Laboratories
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Jason Gibson
University of Florida
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Carlos Chacon
Sandia National Laboratories
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Edwin Chiu
Sandia National Laboratories
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Scott J Grutzik
Sandia National Laboratories
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Khalid Hattar
University of Tennessee - Knoxville, University of Tennessee, Knoxville
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Paul G Kotula
Sandia National Laboratories
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Hojun Lim
Sandia National Laboratories
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Calvin Parkin
Sandia National Laboratories
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Jennie Podlevsky
Sandia National Laboratories
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Aashique Rezwan
Sandia National Laboratories
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Richard G Hennig
University of Florida
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Christopher Bishop
Sandia National Laboratories
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J Matthew D Lane
Sandia National Laboratories