Scanning multiprobe microscopy for mesoscopic devices and materials: Part II

The ability to simultaneously characterize a quantum material or device with several modalities is invaluable for advancing condensed matter physics. We have developed a multimodal scanning probe microscope capable of bringing a generic ensemble of silicon nanofabrication compatible sensors close to mesoscopic devices in cryogenic environments. In part two of this talk, I will present efforts on integrating our multiprobe platform into a cryogen-free dilution refrigerator scanning system. I discuss preliminary results benchmarking the system's performance for atomic force microscopy (AFM), scanning single electron transistor (SET) microscopy, and electrical transport from DC to 10 GHz.