Imaging of magnetization response of soft magnetic thin film using diamond quantum sensors with wide frequency range

ORAL

Abstract

In power electronics, a core loss of inductors in the high-frequency range is a bottleneck for the miniaturization of the system. To develop soft magnetic materials with low loss at high frequency, AC magnetic imaging is effective. Here, we developed a diamond quantum imaging with a wide frequency range.

Using nitrogen-vacancy centers, we performed simultaneous imaging of the amplitude and phase of the AC stray field from a CoFeB-SiO2 thin film, developed for high-frequency inductors. This film has low conductivity derived from the structure of nanomagnetic columns dispersed in an insulator matrix and in-plane uniaxial anisotropy. We imaged a 100-10 kHz AC field by continuous-wave optically-detected magnetic resonance with frequency modulation of the microwave, where the AC signal is down-converted to DC and captured by the camera's speed. The magnetic response correlated with the anisotropy. When the external field was parallel to the easy axis, the phase delayed as frequency increased, implying the loss increased. When perpendicular, the phase didn't delay up to 5 kHz, implying the loss was almost zero. Diamond quantum sensors will help evaluate loss in inductors.

* This work was supported by the MEXT Quantum Leap Flagship Program (JPMXS0118067395) and JST SPRING (JPMJSP2106).

Presenters

  • Ryota Kitagawa

    Tokyo Institute of Technology, Tokyo Institute of Technology, Tokyo

Authors

  • Ryota Kitagawa

    Tokyo Institute of Technology, Tokyo Institute of Technology, Tokyo

  • Aoi Nakatsuka

    Tokyo Institute of Technology

  • Teruo Kohashi

    Hitachi, Ltd.

  • Takeyuki Tsuji

    Tokyo Institute of Technology

  • Honami Nitta

    Tokyo Institute of Technology

  • Yota Takamura

    Tokyo Institute of Technology, Tokyo Institute of Technology, Tokyo

  • Shigeki Nakagawa

    Tokyo Institute of Technology

  • Takayuki Iwasaki

    Tokyo Institute of Technology

  • Amir Yacoby

    Harvard University

  • Mutsuko Hatano

    Tokyo Institute of Technology