Excitation Profile of Bi$_{\mathrm{2}}$Se$_{\mathrm{3}}$, Bi$_{\mathrm{2}}$Te$_{\mathrm{2}}$Se, and Bi$_{\mathrm{2}}$Te$_{\mathrm{3}}$ Single Crystals by Raman Scattering
POSTER
Abstract
Topological Insulators are a class of materials where strong SO coupling results in an insulating bulk and the formation of exotic Dirac fermion metallic surface states. The Raman cross section as a function excitation energy provides information about resonance conditions for interband transitions. Here, we present the results of Raman scattering experiments on Bi$_{\mathrm{2}}$Se$_{\mathrm{3}}$, Bi$_{\mathrm{2}}$Te$_{\mathrm{2}}$Se, and Bi$_{\mathrm{2}}$Te$_{\mathrm{3}}$ single crystals. We present the excitation profile of the phonon intensities of these materials in the visible regime (1.65--3.1eV), corrected for optical constants and spectrometer response, and demonstrate that the cross section for the bulk and surface phonons peaks close to/at the same energy. This indicates that surface resonance effects are responsible for the surface mode intensity increase. Furthermore, we demonstrate that the bulk phonons follow the standard anharmonic decay model as a function of temperature, whereas the surface modes show significant deviation from this model. Electron-phonon interaction may be a major scattering mechanism for Dirac fermions; therefore, a systematic understanding of the behavior of surface phonons in these materials at finite temperatures is important for their applications to spintronic devices.
Authors
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Alexander Lee
Rutgers University, New Brunswick
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Girsh Blumberg
Rutgers University, New Brunswick
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Hsiang- Hsi Kung
Rutgers University, New Brunswick
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Sang-Wook Cheong
Department of Physics and Astronomy, Rutgers University, Rutgers University, New Brunswick, Rutgers University, Rutgers Univ, Rutgers Center for Emergent Materials and Department of Physics and Astronomy, Rutgers University
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Roberto Merlin
University of Michigan
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Ibrahim Boulares
University of Michigan