Fitting Mock X-ray Observations of Simulated Galaxy Clusters

POSTER

Abstract

We investigate statistically whether fitting the actual X-ray spectrum of a galaxy cluster to a single component, unbroadened X-ray spectrum gives a reliable idea of the temperature and metallicity of the cluster. Eighteen different fitting schemes are performed using Xspec on 198 simulated galaxy clusters and their results compared to the emission-measure weighted temperature and metallicity profiles recovered from the simulations.

Authors

  • Andrew Pawl

    Naval Academy Preparatory School