Fitting Mock X-ray Observations of Simulated Galaxy Clusters
POSTER
Abstract
We investigate statistically whether fitting the actual X-ray spectrum of a galaxy cluster to a single component, unbroadened X-ray spectrum gives a reliable idea of the temperature and metallicity of the cluster. Eighteen different fitting schemes are performed using Xspec on 198 simulated galaxy clusters and their results compared to the emission-measure weighted temperature and metallicity profiles recovered from the simulations.
Authors
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Andrew Pawl
Naval Academy Preparatory School