ZnO coated nanosprings: deposition methods, structural and optical properties

POSTER

Abstract

This study presents the effect of film thickness on the structural, morphology and optical properties of ZnO coated Si nanosprings on silicon substrates via sol-gel and atomic layer deposition (ALD). The films coated via sol-gel were dipped 13, 17 and 19 times and the average ZnO grain size was calculated by X-ray diffraction (XRD) at 10, 20 and 27 nm respectively. Also, the ALD films were applied with 80, 120 and 160 cycles and the average grain size is 10, 21 and 30 nm respectively. By increasing the thickness (number of depositions) the crystal structure, Photoluminescence (PL) and Raman Spectra of sol-gel and ALD samples improved due to the better crystallity. Field-Emission Scanning Electron Microscopy in our experiment showed the ALD method results in a better quality film related to the sol-gel growth method.

Authors

  • Negar Rajabi

    University of Idaho Physics Department

  • Dinesh Thapa

    University of Idaho Physics Department, University of Idaho

  • Jesse Huso

    University of Idaho Physics Department, Washington State University, University of Idaho

  • David Mcilroy

    University of Oklahoma

  • Leah Bergman

    University of Idaho Physics Department, University of Idaho