Digital Receptor Image Quality Evaluation:~Effect of Different Filtration Schemes

POSTER

Abstract

The International Electrotechnical Commission provides a standard measurement methodology to provide performance intercomparison between imaging systems. Its formalism specifies beam quality based on half value layer attained by target kVp and additional Al filtration. Similar beam quality may be attained more conveniently using a filtration combination of Cu and Al. This study aimed to compare the two filtration schemes by their effects on image quality in terms of signal-difference-to-noise ratio, spatial resolution, exposure index, noise power spectrum, modulation transfer function, and detective quantum efficiency. A comparative assessment of the images was performed by analyzing commercially available image quality assessment phantom and by following the IEC 62220-3 formalism.

Authors

  • J.A. Summers

    Duke University Medical Physics Graduate Program, Southwest Research Institute, Kettering University, Department of Physics and Astronomy, Wayne State University, Wayne State University, University of Nebraska, University of Stockholm, University of Michigan-Dearborn, Wayne State University, Detroit, MI, Cornell Univ., Air Force Research Labs, Univ. Akron, National Center for Manufacturing Sciences (NCMS), Youngstown State U, Dept. Physics, Department of Natural Sciences, University of Michigan-Dearborn, Department of Physics and Astronomy, Wayne State University, Detroit, Bhabha Atomic Research Centre, Hyderabad, India, NIST Center for Neutron Research, NIST, Gaithersburg, Maryland, Max Planck Institute for Solid State Research, Michigan State University

  • Simon Murphy

    Duke University Medical Physics Graduate Program

  • J.A. Summers

    Duke University Medical Physics Graduate Program, Southwest Research Institute, Kettering University, Department of Physics and Astronomy, Wayne State University, Wayne State University, University of Nebraska, University of Stockholm, University of Michigan-Dearborn, Wayne State University, Detroit, MI, Cornell Univ., Air Force Research Labs, Univ. Akron, National Center for Manufacturing Sciences (NCMS), Youngstown State U, Dept. Physics, Department of Natural Sciences, University of Michigan-Dearborn, Department of Physics and Astronomy, Wayne State University, Detroit, Bhabha Atomic Research Centre, Hyderabad, India, NIST Center for Neutron Research, NIST, Gaithersburg, Maryland, Max Planck Institute for Solid State Research, Michigan State University

  • J.A. Summers

    Duke University Medical Physics Graduate Program, Southwest Research Institute, Kettering University, Department of Physics and Astronomy, Wayne State University, Wayne State University, University of Nebraska, University of Stockholm, University of Michigan-Dearborn, Wayne State University, Detroit, MI, Cornell Univ., Air Force Research Labs, Univ. Akron, National Center for Manufacturing Sciences (NCMS), Youngstown State U, Dept. Physics, Department of Natural Sciences, University of Michigan-Dearborn, Department of Physics and Astronomy, Wayne State University, Detroit, Bhabha Atomic Research Centre, Hyderabad, India, NIST Center for Neutron Research, NIST, Gaithersburg, Maryland, Max Planck Institute for Solid State Research, Michigan State University