Mid-infrared Molecular Emission Studies from Energetic Materials using Laser-Induced Breakdown Spectroscopy

POSTER

Abstract

Laser-induced breakdown spectroscopy (LIBS) is a powerful diagnostic tool for detection of trace elements by monitoring the atomic and ionic emission from laser-induced plasmas. The laser-induced plasma was produced by focusing a 30 mJ pulsed Nd:YAG laser (1064 nm) to dissociate, atomize, and ionize target molecules. In this work, LIBS emissions in the mid-infrared (MIR) region were studied for potential applications in chemical, biological, and explosives (CBE) sensing. We report on the observation of MIR emissions from energetic materials (e.g. ammonium compounds) due to laser-induced breakdown processes. All samples showed LIBS-triggered oxygenated breakdown products as well as partially dissociated and recombination molecular species. More detailed results of the performed MIR LIBS studies on the energetic materials will be discussed at the conference.

Authors

  • Ei Brown

    Hampton University

  • Uwe Hommerich

    Hampton University

  • Rahul Kulkarni

    Materials and Structures Laboratory, Tokyo Institute of Technology, Jefferson Lab, 12000 Jefferson Avenue, MS 58, Suite 17, Newport News, VA 23606, VirginiaTech, Department of Physics, University of South Alabama, New York University, University of Tennessee Knoxville, Georgia College, North Georgia College \& State Univ., North Carolina Central University, TUNL, James Madison University, Physics Department, Hollins University; JQI, University of Aarhus, University of Tennessee, UNC at Asheville, The College of New Jersey, CERN, Florida Institute of Technology, Mechanical Engineering Department, University of New Mexico, Department of Physics, Florida State University, JINR, Vanderbilt, Tsinghua University, LBNL, Vanderbilt and LBNL, Vanderbilt University, Vanderbilt University, Tsinghua University, Vanderbilt University, LBNL, NBPHS, Vanderbilt University, Dept. of Physics and Astronomy - James Madison University, National High Magnetic Field Laboratory, U. of South Alabama Dept. of Chemistry, U. of South Alabama Dept. of Physics, Ohio State University, Wright State University, Engineering Science and Mechanics, Virginia Tech, US, Department of Nanobio Materials and Electronics, GIST, Republic of Korea, Department of Physics, Virginia Tech

  • Rahul Kulkarni

    Materials and Structures Laboratory, Tokyo Institute of Technology, Jefferson Lab, 12000 Jefferson Avenue, MS 58, Suite 17, Newport News, VA 23606, VirginiaTech, Department of Physics, University of South Alabama, New York University, University of Tennessee Knoxville, Georgia College, North Georgia College \& State Univ., North Carolina Central University, TUNL, James Madison University, Physics Department, Hollins University; JQI, University of Aarhus, University of Tennessee, UNC at Asheville, The College of New Jersey, CERN, Florida Institute of Technology, Mechanical Engineering Department, University of New Mexico, Department of Physics, Florida State University, JINR, Vanderbilt, Tsinghua University, LBNL, Vanderbilt and LBNL, Vanderbilt University, Vanderbilt University, Tsinghua University, Vanderbilt University, LBNL, NBPHS, Vanderbilt University, Dept. of Physics and Astronomy - James Madison University, National High Magnetic Field Laboratory, U. of South Alabama Dept. of Chemistry, U. of South Alabama Dept. of Physics, Ohio State University, Wright State University, Engineering Science and Mechanics, Virginia Tech, US, Department of Nanobio Materials and Electronics, GIST, Republic of Korea, Department of Physics, Virginia Tech

  • Rahul Kulkarni

    Materials and Structures Laboratory, Tokyo Institute of Technology, Jefferson Lab, 12000 Jefferson Avenue, MS 58, Suite 17, Newport News, VA 23606, VirginiaTech, Department of Physics, University of South Alabama, New York University, University of Tennessee Knoxville, Georgia College, North Georgia College \& State Univ., North Carolina Central University, TUNL, James Madison University, Physics Department, Hollins University; JQI, University of Aarhus, University of Tennessee, UNC at Asheville, The College of New Jersey, CERN, Florida Institute of Technology, Mechanical Engineering Department, University of New Mexico, Department of Physics, Florida State University, JINR, Vanderbilt, Tsinghua University, LBNL, Vanderbilt and LBNL, Vanderbilt University, Vanderbilt University, Tsinghua University, Vanderbilt University, LBNL, NBPHS, Vanderbilt University, Dept. of Physics and Astronomy - James Madison University, National High Magnetic Field Laboratory, U. of South Alabama Dept. of Chemistry, U. of South Alabama Dept. of Physics, Ohio State University, Wright State University, Engineering Science and Mechanics, Virginia Tech, US, Department of Nanobio Materials and Electronics, GIST, Republic of Korea, Department of Physics, Virginia Tech

  • Rahul Kulkarni

    Materials and Structures Laboratory, Tokyo Institute of Technology, Jefferson Lab, 12000 Jefferson Avenue, MS 58, Suite 17, Newport News, VA 23606, VirginiaTech, Department of Physics, University of South Alabama, New York University, University of Tennessee Knoxville, Georgia College, North Georgia College \& State Univ., North Carolina Central University, TUNL, James Madison University, Physics Department, Hollins University; JQI, University of Aarhus, University of Tennessee, UNC at Asheville, The College of New Jersey, CERN, Florida Institute of Technology, Mechanical Engineering Department, University of New Mexico, Department of Physics, Florida State University, JINR, Vanderbilt, Tsinghua University, LBNL, Vanderbilt and LBNL, Vanderbilt University, Vanderbilt University, Tsinghua University, Vanderbilt University, LBNL, NBPHS, Vanderbilt University, Dept. of Physics and Astronomy - James Madison University, National High Magnetic Field Laboratory, U. of South Alabama Dept. of Chemistry, U. of South Alabama Dept. of Physics, Ohio State University, Wright State University, Engineering Science and Mechanics, Virginia Tech, US, Department of Nanobio Materials and Electronics, GIST, Republic of Korea, Department of Physics, Virginia Tech