Probing spectral and directional emission properties of hybrid perovskite thin films

Hybrid organic-inorganic perovskites have recently emerged as promising candidate for nanophotonics and optoelectronic applications. Here we fabricate large-grain hybrid perovskites thin films using a solution-processed technique, and probe its nanoscale emission properties using Fourier imaging microscopy. Furthermore, by spectrally mapping the emission properties of our films with sub-micron resolution, we observe strong dependence of emission properties on the film morphology. Effects of domain crystallinity, emission from defect states and photon recycling are discussed within the framework of Fourier imaging spectroscopy.