Single-Shot Ellipsometry for the Z-Machine

We have developed a single-shot ellipsometry diagnostic capable of taking time-resolved measurements. A comparison of dielectric constants obtained using this method with those from a standard spectroscopic ellipsometry technique showed good agreement when used to measure a static Au sample. The ellipsometer is being designed for use on the Z-machine at Sandia National Laboratories to measure the conductivity of Fe at pressures and temperatures of the Earth's core.