Role of Defects in Optoelectronics and Transport

ORAL · MAR-A43 · ID: 3110523







Presentations

  • ORAL

    Publication: Trippe el al. "Effectiveness of NIEL as a Predictor of Single Event Displacement Damage Effects in CMOS Circuits". IEEE TNS (in second round of review).

    Future paper regarding the simulation framework and physics discussed in this presentation.

    Presenters

    • Grant Mark Mayberry

      • Department of Physics and Astronomy, Vanderbilt University
      • Vanderbilt University

    Authors

    • Grant Mark Mayberry

      • Department of Physics and Astronomy, Vanderbilt University
      • Vanderbilt University
    • James M Trippe

      • Vanderbilt University
    • Xiao Shen

      • University of Memphis
    • Dennis R Ball

      • Department of Electrical and Computer Engineering, Vanderbilt University
      • Vanderbilt University
    • Robert A Reed

      • Vanderbilt University
    • Ronald D Schrimpf

      • Department of Electrical and Computer Engineering, Vanderbilt University
      • Vanderbilt University
    • Sokrates T Pantelides

      • Vanderbilt University
      • Department of Physics and Astronomy, Vanderbilt University

    View abstract →

  • ORAL

    Presenters

    • Chandima Kasun Edirisinghe

      • University of Tennessee

    Authors

    • Chandima Kasun Edirisinghe

      • University of Tennessee
    • Anuradha K Wijesinghe

      • University of Tennessee
    • Pradip Adhikari

      • University of Tennessee
    • Anjali Rathore

      • University of Tennessee
    • Christopher M Rouleau

      • Oak Ridge National Laboratory
    • Joon Sue Lee

      • University of Tennessee
      • University of Tennessee, Knoxville

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  • ORAL

    Publication: [1] W. MacSwain, H. Lin, Z. -J. Li, S. Li, C. Chu, L. Dube, O. Chen, G. Leem, and W. Zheng, J. Mater. Chem. A 11, 7066-7076 (2023).
    [2] C. Wisehart, W. MacSwain, W. Zheng, and Y. S. Li, in preparation.

    Presenters

    • Christopher Wisehart

      • California State University, Bakersfield

    Authors

    • Christopher Wisehart

      • California State University, Bakersfield
    • Walker MacSwain

      • Syracuse University
    • Weiwei Zheng

      • Syracuse University
    • Yize Stephanie Li

      • California State University, Bakersfield

    View abstract →

  • ORAL

    Publication: Alexandre Wagemakers, Aleksi Hartikainen, Alvar Daza, Esa Räsänen, Miguel A. F. Sanjuan, Chaotic dynamics creates and destroys branched flow, submitted; https://arxiv.org/abs/2406.12922.

    Presenters

    • Esa Rasanen

      • Tampere University

    Authors

    • Esa Rasanen

      • Tampere University
    • Alexandre Wagemakers

      • Universidad Rey Juan Carlos, Madrid
    • Aleksi Hartikainen

      • Tampere University
    • Alvar Daza

      • Universidad Rey Juan Carlos, Madrid
    • Esko Toivonen

      • Tampere University
    • Miguel A.F. Sanjuan

      • Universidad Rey Juan Carlos, Madrid

    View abstract →