Understanding the growth of rutile Ge oxides in hybrid MBE
ORAL
Abstract
Nanostructured oxide materials hold significant promise for advanced electronic and sensing applications due to their tunable electronic properties. Rutile GeO2 is one such material that has garnered attention for its ultrawide band gap and potential in high-power electronics. However, challenges in synthesizing high-quality thin films hinder the exploration of its intrinsic properties. In this talk, I will present the growth of Sn1-xGexO2 films through oxygen-plasma-assisted hybrid molecular beam epitaxy (hMBE) using metal-organic precursors. We examine how composition, temperature, and precursor flux influence film quality and phase formation, with insights guided by density functional theory (DFT) calculations. Our findings show that up to 34% Ge can be incorporated into Sn1-xGexO2, beyond which spinodal decomposition leads to amorphization and Ge volatility. Vapor pressure calculations based on DFT-fit regular solution models indicate that optimizing temperature and oxygen partial pressure is essential to control volatility while ensuring sufficient kinetics for film crystallization. These results demonstrate how ab-initio thermodynamic calculations can be leveraged to understand the growth of multi-component oxide materials.
*This work is supported primarily by the National Science Foundation (NSF) through the Future of Semiconductor (FuSe) grant under award number DMR-2328702, and partially though the FuSe teaming grant (FuSe-TG) (Award number DMR-2235208). We also acknowledge partial support supported by the Air Force Office of Scientific Research (AFOSR) through Grants FA9550-21-1-0025 and FA9550-23-1-0247. Film growth was performed using instrumentation funded by AFOSR DURIP awards FA9550-18-1-0294 and FA9550-23-1-0085. Computations were performed using the Minnesota Supercomputing Institute (MSI) at the University of Minnesota.
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Presenters
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Nathan Szymanski
- University of Minnesota