Advances in RF-THz Scanning Probe Microscopy and Scanning Probe Magnetometry

FOCUS · MAR-G39 · ID: 3090102







Presentations

  • ORAL · Invited

    Publication: Atomic-scale terahertz time-domain spectroscopy - https://doi.org/10.1038/s41566-024-01467-2

    Presenters

    • Vedran Jelic

      • University of Alberta
      • National Research Council Canada

    Authors

    • Stefanie Adams

      • Michigan State University
    • Vedran Jelic

      • University of Alberta
      • National Research Council Canada
    • Mohamed A Hassan

      • Michigan State University
    • Kaedon Cleland-Host

      • Michigan State University
    • Eve Ammerman

      • Michigan State University
    • Tyler L Cocker

      • Michigan State University

    View abstract →

  • ORAL

    Publication: https://doi.org/10.48550/arXiv.2410.08704

    Presenters

    • Jinwon Lee

      • Delft University of Technology

    Authors

    • Jinwon Lee

      • Delft University of Technology
    • Evert W Stolte

      • Delft University of Technology
    • Hester Vennema

      • Delft University of Technology
    • Rik Broekhoven

      • Delft University of Technology
    • Esther Teng

      • Delft University of Technology
    • Allard Katan

      • Delft University of Technology
    • Lukas M Veldman

      • University of Stuttgart
    • Philip Willke

      • Karlsruhe Institute of Technology
    • Sander Otte

      • Delft University of Technology

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  • ORAL

    Presenters

    • Robbie Elbertse

      • NIST
      • National Institute of Standards and Technology (NIST), University of Maryland (UMD)

    Authors

    • Robbie Elbertse

      • NIST
      • National Institute of Standards and Technology (NIST), University of Maryland (UMD)
    • Sungmin Kim

      • National Institute of Standards and Technology (NIST) & University of Maryland, College Park
      • National Institute of Standards and Technology (NIST), University of Maryland (UMD)
    • Dilek Yildiz

      • National Institute of Standards and Technology (NIST), University of Maryland (UMD)
    • Daniel T Walkup

      • National Institute of Standards and Technology (NIST)
    • Steven Blankenship

      • National Institute of Standards and Technology, Gaithersburg
      • National Institute of Standards and Technology (NIST)
    • Joseph A Stroscio

      • National Institute of Standards and Technology (NIST)

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  • ORAL

    Publication: [1] Vasyukov, D., Anahory, Y., Embon, L. et al. A scanning superconducting quantum interference device with single electron spin sensitivity. Nature Nanotech 8, 639–644 (2013)
    [2] Halbertal, D., Cuppens, J., Shalom, M. et al. Nanoscale thermal imaging of dissipation in quantum systems. Nature 539, 407–410 (2016)
    [3] Zhou, H., Auerbach, N., Roy, I. et al. Scanning SQUID-on-tip microscope in a top-loading cryogen-free dilution refrigerator. Rev. Sci. Instrum. 94, 053706 (2023)

    Presenters

    • Ruoxi Zhang

      • University of California, Santa Barbara

    Authors

    • Ruoxi Zhang

      • University of California, Santa Barbara
    • Trevor B Arp

      • University of California, Santa Barbara
    • Owen I Sheekey

      • University of California, Santa Barbara
    • Noah L Samuelson

      • University of California, Santa Barbara
    • Andrea F Young

      • University of California, Santa Barbara
      • University of California Santa Barbara
      • University of California at Santa Barbara

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  • ORAL

    Presenters

    • Thijs Roskamp

      • University of Twente

    Authors

    • Thijs Roskamp

      • University of Twente
    • Tim Horstink

      • Bruker Nederland B.V.
    • Melissa Goodwin

      • University of Twente
    • Erwin Berenschot

      • University of Twente
    • Edin Sarajlic

      • Bruker Nederland B.V.
    • Niels Tas

      • University of Twente
    • Hans Hilgenkamp

      • University of Twente

    View abstract →