Impact of surface growth method and surface treatment in niobium-based superconducting devices
ORAL
Abstract
We explore the comparison between two growth methods for niobium film - sputtering and electron-cyclotron resonance growth - for niobium-based superconducting resonators. We discuss some of the key properties of the films, including surface characterization and residual resistance measurements metrics.
We present our design of various devices used in this study including superconducting resonators and qubits, both in planar configurations and integrated in 3D cavities, as well as experimental characterization of coherence metrics.
We present our design of various devices used in this study including superconducting resonators and qubits, both in planar configurations and integrated in 3D cavities, as well as experimental characterization of coherence metrics.
*This material is based upon work supported by the U.S. Department of Energy, Office of Science, National Quantum Information Science Research Centers, Superconducting Quantum Materials and Systems Center (SQMS) under contract number DE-AC02-07CH11359.
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Presenters
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Adrian Lupascu
- University of Waterloo