Machine Learning for Instrumentation and Measurement Science

FOCUS · MAR-S39 · ID: 3090175

Presentations

  • ORAL · Invited

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    Presenters

    • Stephen Jesse

      • Oak Ridge National Laboratory

    Authors

    • Stephen Jesse

      • Oak Ridge National Laboratory

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  • ORAL

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    Publication: Ma, Desheng, et al. "Physics-informed Bayesian Optimization of an Electron Microscope." (2023): 1875-1877.

    Presenters

    • Desheng Ma

      • Cornell University

    Authors

    • Desheng Ma

      • Cornell University

    • Steven E Zeltmann

      • Cornell University

    • Desheng Ma

      • Cornell University

    • Yu-Tsun Shao

      • University of Southern California

    • Zhaslan Baraissov

      • Cornell University

    • Cameron James Richard Duncan

      • Cornell University

    • Adi Hanuka

      • SLAC National Accelerator Laboratory

    • Auralee Edelen

      • SLAC National Accelerator Laboratory

    • Jared Maxson

      • Cornell University

    • David A Muller

      • Cornell University

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  • ORAL

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    Publication: N. Schoinas, Y. Rath, S. Norimoto, W. Xie, P. See, J. P. Griffiths, C. Chen, D. A. Ritchie, M. Kataoka, A. Rossi, I. Rungger; Fast characterization of multiplexed single-electron pumps with machine learning. Appl. Phys. Lett. 16 September 2024; 125 (12): 124001. https://doi.org/10.1063/5.0221387

    Presenters

    • Yannic Rath

      • National Physical Laboratory

    Authors

    • Yannic Rath

      • National Physical Laboratory

    • Nikolaos Schoinas

      • National Physical Laboratory

    • Shota Norimoto

      • National Physical Laboratory

    • Masaya Kataoka

      • National Physical Laboratory

    • Alessandro Rossi

      • University of Strathclyde

    • Ivan Rungger

      • National Physical Laboratory (NPL)
      • National Physical Laboratory

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  • ORAL

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    Presenters

    • Chi-Huan Tung

      • Oak Ridge National Laboratory

    Authors

    • Chi-Huan Tung

      • Oak Ridge National Laboratory

    • Wei-Ren Chen

      • Oak Ridge National Lab

    • Changwoo Do

      • Oak Ridge National Lab
      • Oak Ridge National Laboratory

    • Lijie Ding

      • Oak Ridge National Laboratory

    • Jan-Michael Y Carrillo

      • Oak Ridge National Laboratory
      • Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, 1 Bethel Valley Rd, Oak Ridge, TN 37830

    • Bobby G Sumpter

      • Oak Ridge National Laboratory

    • Ming-Ching Chang

      • University at Albany - State University of New York

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  • ORAL

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    Publication: 1) R. A. W. Ayyubi, James P. Buban, Robert F. Klie, Automated Defect Detection in Atomic Resolution STEM Images: A Machine Learning Approach with Variational Convolutional Autoencoders, Microscopy and Microanalysis, Volume 30, Issue Supplement_1, July 2024, ozae044.180, https://doi.org/10.1093/mam/ozae044.180
    2) In Preparation: R. A. W. Ayyubi, James P. Buban, Robert F. Klie, Defect-Based Clustering of Atomic Resolution STEM Images Using Variational Convolutional Autoencoders.

    Presenters

    • Raja Abdul Wahab Ayyubi

      • University of Illinois at Chicago

    Authors

    • Raja Abdul Wahab Ayyubi

      • University of Illinois at Chicago

    • Seyfal Sultanov

      • University of Illinois at Chicago

    • James P Buban

      • University of Illinois at Chicago

    • Robert F Klie

      • University of Illinois at Chicago

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  • ORAL

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    Publication: https://arxiv.org/abs/2410.02991
    Accepted by NeurIPS 2024 ML4PS Workshop
    https://indico.cern.ch/event/1387540/contributions/6153578/

    Presenters

    • Alexander C Migala

      • University of California, San Diego

    Authors

    • Alexander C Migala

      • University of California, San Diego

    • Eugene Ku

      • Argonne National Laboratory

    • Zepeng Li

      • University of California, San Diego

    • Aobo Li

      • University of California, San Diego

    View abstract →