Percolative phase transition in few-layered MoSe<sub>2</sub> field-effect transistors using Co and Cr contacts
ORAL
Abstract
The metal-to-insulator (MIT) phase transition in two-dimensional (2D) materials under the influence of a gating electric field has revealed interesting electronic transport phenomena. Although the mechanism of the MIT in 2D semiconductors is a topic under debate, our work addresses the tunable percolative phase transition in few-layered MoSe2 field-effect transistors (FET) with various metallic contacts. Here, we attempted to understand the MIT through temperature-dependent electronic transport measurements under the influence of an applied gate voltage. We examined the phenomenon with devices using two different kinds of metal contacts: more conventional chromium (Cr) and ferromagnetic cobalt (Co). The temperature-dependent conductivity data showed insulating-to-metallic behavior as a function of increasing carrier density, which was analyzed by fitting the data to the theory of a percolative phase transition.
*Funding for this work was provided by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences program under Award Number DE-SC0024072. Use of the Center for Nanoscale Materials, a Department of Energy Office of Science User Facility, was supported by the U.S. DOE, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. A portion of this work was performed at the National High Magnetic Field Laboratory, which is supported by the National Science Foundation Cooperative Agreements No. DMR-1644779 and DMR-2128556 and the State of Florida.
–
Presenters
-
Stephen A McGill
- National High Magnetic Field Laboratory