Position-sensitive foil thickness measurements using alpha energy loss

Oral-In-person

Abstract

Alpha energy loss is a common tool used to measure target thicknesses. However, these measurements are often made without position information, either forfeiting knowledge of material uniformity and local thickness or requiring a prohibitive number of measurements per target to partially recover this information. In consideration, a method for measuring position-dependent thickness was developed using a position-sensitive dual-axis duo-lateral (DADL) silicon detector. With a single measurement, thicknesses across the entire face of a material can be measured to a sub-mm position resolution. Several examples will be presented using targets with varying characteristics, demonstrating the precision, accuracy, and versatility of the technique.

Publication: Thickness and uniformity mapping of thin foils using resistive silicon detectors, Nucl. Instr. and Meth. B, 566, 165788 (2025)

Presenters

  • Travis Hankins

    • Texas A&M University

Authors

  • Travis Hankins

    • Texas A&M University
  • Alan McIntosh

    • Texas A&M University, Cyclotron Institute
  • Kris Hagel

    • Texas A&M University, Cyclotron Institute
  • Austin Abbott

    • Texas A&M University, Cyclotron Institute
  • Arthur Alvarez

    • Texas A&M University, Cyclotron Institute
  • Robert Bartsch

    • Texas A&M University, Cyclotron Institute
  • Millyzient McClure

    • TAMU CI; Hastings College
  • Sebastian Regener

    • Texas A&M University, Cyclotron Institute
  • Maxwell Sorensen

    • Texas A&M University, Cyclotron Institute
  • Sherry Yennello

    • Texas A&M University, College Station