Position-sensitive foil thickness measurements using alpha energy loss
ORAL
Abstract
Alpha energy loss is a common tool used to measure target thicknesses. However, these measurements are often made without position information, either forfeiting knowledge of material uniformity and local thickness or requiring a prohibitive number of measurements per target to partially recover this information. In consideration, a method for measuring position-dependent thickness was developed using a position-sensitive dual-axis duo-lateral (DADL) silicon detector. With a single measurement, thicknesses across the entire face of a material can be measured to a sub-mm position resolution. Several examples will be presented using targets with varying characteristics, demonstrating the precision, accuracy, and versatility of the technique.
*Supported by the following: Department of Energy, USA Grant DE-FG02-93ER40773 & Department of Energy, National Nuclear Security Administration, USA Grants DE-NA0003841 and DE-NA0004150 & National Science Foundation Research Experience for Undergraduates, USA Grant PHY-1659847 & Department of Energy, USA Grant DE-SC0022469. This research used targets provided by the Center for Accelerator Target Science at Argonne National Laboratory, which is a DOE Office of Science User Facility and supported by the U.S. Department of Energy, Office of Nuclear Physics, under Award No. DE-AC02-06CH11357.
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Publication:Thickness and uniformity mapping of thin foils using resistive silicon detectors, Nucl. Instr. and Meth. B, 566, 165788 (2025)
