Tunneling Energy and Capacitance of Twist-Controlled Graphene Double Layers Separated by Boron Nitride Barriers

ORAL

Abstract

In recent years, two dimensional (2D) materials-based resonant tunneling devices have been constructed using an increasing variety of electrode and barrier combinations. Consequently, it is informative to experimentally establish the tunneling current-voltage characteristics as a function of barrier parameters, and theoretically capture these data within a model with few tunable parameters. To that end, we study dual-gated double monolayer graphene heterostructures, consisting of two twist aligned graphene electrodes separated by hexagonal boron nitride (hBN) tunnel barriers of different thicknesses. Because the two graphene layers’ crystal axes are aligned throughout fabrication, we observe energy and momentum conserving resonant tunneling characterized by gate-tunable negative differential resistance. Data from a large set of devices show similar resonant tunneling characteristics that can be captured by a simple framework with two barrier-dependent parameters: interlayer hopping energy (t) and interlayer capacitance (CInt). We find that interlayer hopping energy decreases by three orders of magnitude as the hBN tunnel barrier increases from two to seven layers. We compare the interlayer hopping energy and capacitance to previous data reported in literature.

*The work at The University of Texas at Austin was supported by the National Science Foundation (NSF) Grants No. MRSEC DMR-2308817 and No. ECCS-2122476, Army Research Office under Grant No. W911NF-22-1-2, and the Welch Foundation Grant No. F-2169-20230405.

Publication: "Tunneling Energy and Capacitance of Twist Controlled Double Layers Separated by Boron Nitride Barriers", submitted.

Presenters

  • Kenneth Alexander Lin

    • University of Texas at Austin
    • Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA

Authors

  • Kenneth Alexander Lin

    • University of Texas at Austin
    • Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA
  • Brooke Ramey

    • University of Texas at Austin
  • Nitin Prasad

    • University of Maryland College Park
  • G W Burg

    • University of Texas at Austin
  • Kenji Watanabe

    • National Institute for Materials Science
    • Research Center for Functional Materials, National Institute of Materials Science, 1-1 Namiki Tsukuba, Ibaraki 305-0044, Japan
  • Takashi Taniguchi

    • National Institute for Materials Science
    • Research Center for Materials Nanoarchitectonics, National Institute for Materials Science
    • International Center for Materials Nanoarchitectonics, National Institute of Materials Science, 1-1 Namiki Tsukuba, Ibaraki 305-0044, Japan
    • Research Center for Functional Materials, National Institute of Materials Science, 1-1 Namiki Tsukuba, Ibaraki 305-0044, Japan
  • Emanuel Tutuc

    • University of Texas at Austin
    • Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA