Deveplopment of a Scanned SQUID Microscopy system with Integrated High-Speed Electrical Connectivity.

ORAL

Abstract

Trapped magnetic flux is a key factor limiting the coherence and stability of superconducting circuits, yet direct visualization and correlation with circuit performance remain challenging. We have developed a scanned SQUID microscope (SSM) capable of simultaneous magnetic imaging and high-speed electrical measurements. The cryogen-free system achieves a flux noise level of 1.3 μΦ0/Hz1/2 at base temperature of 3.3 K and supports up to 40 high-frequency electrical lines. A cryogenic chip socket and silicon interposer provide robust electrical connectivity at 4 K with approximately 15 db RF loss at 20 GHz. We present preliminary results demonstrating the system's capabilities, including measurements of current-phase relationship of rfSQUIDs, imaging of magnetic vortices, active superconducting currents, and magnetic Josephson junctions.

–

Publication: I. W. Haygood, B. Xu, J. Biesecker, M. L. Schneider, "Scanned SQUID Microscope with High-speed Electrical Connectivity." (2025) arXiv:2509.07137

Presenters

  • Bochao Xu

    • National Institute of Standards and Technology
    • National Institute of Standard and Technology

Authors

  • Bochao Xu

    • National Institute of Standards and Technology
    • National Institute of Standard and Technology

  • Ian Haygood

    • National Institute of Standards and Technology
    • National Institute of Standard and Technology

  • John P Biesecker

    • National Institute of Standards and Technology
    • National Institute of Standard and Technology

  • Michael L Schneider

    • Applied Physics Division, Physical Measurement Laboratory, NIST, Boulder, CO
    • National Institute of Standards and Technology
    • National Institute of Standard and Technology