Tomographic characterization of leakage in superconducting quantum gates, Part 2

Oral-In-person

Abstract

Leakage errors in superconducting qubits can arise during both single and two-qubit gates. If unmitigated, these errors may limit the performance of quantum error correction. In particular, many common implementations of a CZ gate in superconducting qubits exploit transitions outside of the computational manifold, and improper calibration can give rise to leakage errors. Building on our leakage characterization work in single-qubit gates, we extend the tomographic leakage modeling presented in the prior talk to a two-qubit CZ gate. We will present experimental gate set tomography as a function of induced leakage, and we compare to other standard characterization techniques.

Presenters

  • Katrina Sliwa

    • MIT Lincoln Laboratory

Authors

  • Katrina Sliwa

    • MIT Lincoln Laboratory
  • Nathan Miller

    • MIT Lincoln Laboratory
  • Riley Murray

  • Luke Burkhart

  • Gabriel Samach

    • MIT Lincoln Laboratory
  • Corey Ostrove

    • Sandia National Laboratories
  • Kenneth Rudinger

    • Sandia National Laboratories
  • Tristan Brown

  • Piper Wysocki

    • Sandia National Laboratories
  • Madeline Morocco

    • MIT Lincoln Laboratory
  • David Danza

  • Rabindra Das

    • Massachusetts Institute of Technology MIT
  • Jeffrey Gertler

    • MIT Lincoln Laboratory
  • Michael Gingras

    • MIT Lincoln Laboratory
  • Michael Hellstrom

  • David Kim

    • MIT Lincoln Lab
  • Bethany Huffman

  • Meghan Schuldt

  • Hannah Stickler

    • MIT Lincoln Laboratory
  • Donna-Ruth Yost

    • Massachusetts Institute of Technology
  • Kyle Serniak

    • MIT Lincoln Laboratory
  • Steven Weber

    • MIT Lincoln Laboratory
  • Robin Blume-Kohout

    • Sandia National Laboratories
  • Mollie Schwartz

    • MIT Lincoln Laboratory