Tomographic characterization of leakage in superconducting quantum gates, Part 2
Oral-In-person
Abstract
Leakage errors in superconducting qubits can arise during both single and two-qubit gates. If unmitigated, these errors may limit the performance of quantum error correction. In particular, many common implementations of a CZ gate in superconducting qubits exploit transitions outside of the computational manifold, and improper calibration can give rise to leakage errors. Building on our leakage characterization work in single-qubit gates, we extend the tomographic leakage modeling presented in the prior talk to a two-qubit CZ gate. We will present experimental gate set tomography as a function of induced leakage, and we compare to other standard characterization techniques.
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Presenters
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Katrina Sliwa
- MIT Lincoln Laboratory