Band Structure of GeSn alloys probed by ARPES
ORAL
Abstract
Ge1-xSnx alloys offers a pathway to engineer direct band gaps within group-IV semiconductors; however, their intrinsic electronic structure remains underexplored. We employ polarization-dependent angle-resolved photoemission spectroscopy (ARPES) to probe the strain- and compositional-driven valence band modifications in epitaxial Ge1-xSnx (x = 0, 0.05, 0.10) films grown by molecular beam epitaxy. Core-level XPS confirms uniform Sn incorporation into the Ge lattice. With increasing Sn doping content, ARPES reveals enhanced spin-orbit splitting. ARPES matrix element effects disentangle heavy-hole and light-hole bands and point to the lift of degeneracy due to biaxial compressive strain.
*This work was supported as part of μ-ATOMS, an Energy Frontier Research Center funded by the U.S. Department of Energy, Office of Science, Basic Energy Sciences under award DE-SC0023412.
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Presenters
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Ram D Joshi
- University of Arkansas