Spectroscopy of two-level system defects in fluxonium: Part 1

Oral-In-person

Abstract


Dielectric loss is a dominant source of noise in superconducting qubits and remains a central obstacle to achieving longer coherence times in quantum processors. To better characterize this loss mechanism, we study the coupling between fluxonium qubits and two-level system (TLS) defects. We employ fast-flux pulsing techniques to measure the frequency and temporal dependence of TLS-induced energy-relaxation errors. Leveraging the tunability of fluxonium qubits allows us to explore TLS properties across a wide frequency range. In the first part of this two-part talk, we discuss the experimental implementation and identification of TLS. 

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Presenters

  • Serra Erdamar

Authors

  • Serra Erdamar

  • Mallika Randeria

    • MIT Lincoln Laboratory

  • Jeffrey Gertler

    • MIT Lincoln Laboratory

  • Alec Emser

    • MIT Lincoln Laboratory

  • Tristan Brown

  • Kunal L. Tiwari

    • MIT Lincoln Laboratory

  • Benjamin Freiman

  • Renée DePencier Piñero

    • MIT Lincoln Laboratory

  • Thomas Hazard

    • MIT Lincoln Laboratory

  • Kate Azar

    • MIT

  • Michael Gingras

    • MIT Lincoln Laboratory

  • Bethany Niedzielski

    • MIT Lincoln Laboratory

  • Hannah Stickler

    • MIT Lincoln Laboratory

  • Mollie Schwartz

    • MIT Lincoln Laboratory

  • Kyle Serniak

    • MIT Lincoln Laboratory