Spectroscopy of two-level system defects in fluxonium: Part 2 

Oral-In-person

Abstract


Dielectric loss is a dominant source of noise in superconducting qubits and remains a central obstacle to achieving longer coherence times in quantum processors. To better characterize this loss mechanism, we study the coupling between fluxonium qubits and two-level system (TLS) defects. We employ fast-flux pulsing techniques to measure the frequency and temporal dependence of TLS-induced energy-relaxation errors. Leveraging the tunability of fluxonium qubits allows us to explore TLS features across a wide frequency range. In the second part of this two-part talk, we discuss analysis of key TLS properties. This technique provides a tool for comparing device design, materials choice, and fabrication process optimization towards improved qubit coherence.  

 


This material is based upon work supported under Air Force Contract No. FA8702-15-D-0001. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the U.S. government or the U.S. Air Force. 

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Presenters

  • Mallika Randeria

    • MIT Lincoln Laboratory

Authors

  • Mallika Randeria

    • MIT Lincoln Laboratory

  • Serra Erdamar

  • Jeffrey Gertler

    • MIT Lincoln Laboratory

  • Alec Emser

    • MIT Lincoln Laboratory

  • Tristan Brown

  • Kunal L. Tiwari

    • MIT Lincoln Laboratory

  • Benjamin Freiman

    • MIT Lincoln Laboratory

  • Renée DePencier Piñero

  • Thomas Hazard

    • MIT Lincoln Laboratory

  • Kate Azar

    • MIT Lincoln Laboratory

  • Michael Gingras

    • MIT Lincoln Laboratory

  • Bethany Niedzielski

  • Hannah Stickler

    • MIT Lincoln Laboratory

  • Mollie Schwartz

    • MIT Lincoln Laboratory

  • Kyle Serniak

    • MIT Lincoln Laboratory