Spectroscopy of two-level system defects in fluxonium: Part 2 

ORAL

Abstract


Dielectric loss is a dominant source of noise in superconducting qubits and remains a central obstacle to achieving longer coherence times in quantum processors. To better characterize this loss mechanism, we study the coupling between fluxonium qubits and two-level system (TLS) defects. We employ fast-flux pulsing techniques to measure the frequency and temporal dependence of TLS-induced energy-relaxation errors. Leveraging the tunability of fluxonium qubits allows us to explore TLS features across a wide frequency range. In the second part of this two-part talk, we discuss analysis of key TLS properties. This technique provides a tool for comparing device design, materials choice, and fabrication process optimization towards improved qubit coherence.  

 


This material is based upon work supported under Air Force Contract No. FA8702-15-D-0001. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the U.S. government or the U.S. Air Force. 

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Presenters

  • Mallika T Randeria

    • MIT Lincoln Laboratory

Authors

  • Mallika T Randeria

    • MIT Lincoln Laboratory

  • Serra Erdamar

    • MIT Lincoln Laboratory

  • Jeffrey M Gertler

    • MIT Lincoln Laboratory

  • Alec L Emser

    • MIT Lincoln Laboratory

  • Tristan Brown

    • MIT Lincoln Laboratory

  • Kunal L. Tiwari

    • MIT Lincoln Laboratory

  • Benjamin Robert Freiman

    • MIT Lincoln Laboratory

  • Renée DePencier Piñero

    • MIT Lincoln Laboratory

  • Thomas M Hazard

    • MIT Lincoln Laboratory

  • Kate Azar

    • MIT Lincoln Laboratory

  • Michael A Gingras

    • MIT Lincoln Laboratory

  • Bethany M Niedzielski

    • MIT Lincoln Laboratory

  • Hannah M Stickler

    • MIT Lincoln Laboratory

  • Mollie E. Schwartz

    • MIT Lincoln Laboratory

  • Kyle Serniak

    • MIT Lincoln Laboratory