Wafer Level Testing and Validation for CMS experiment Readout Chips (CROCv2)

The CMS Collaboration at CERN performs experiments at the forefront of High Energy Physics research, enabling the discovery of new particles and furthering our understanding of the standard model of particle physics and beyond. These discoveries are made possible through the use of advanced sensors and detector chips. The CMS detector is undergoing upgrades to increase the number and detection of particle collusions. This upgrade will be completed in coming years and will utilize new pixel readout chips; the CROCv2 project integrates the modern advancements in integrated circuit development for high luminosity detection with very high radiation resistance. My research covers the proper testing procedure for the CROCv2 chips and the maintaining of a sterile, safe environment to not risk unwanted exposure to the bare silicon. I used cleanroom particle count monitors, tested various cleaning strategies, adjusted the testing procedure for the wafers, and analysed results for a clean, efficient testing process. Through my research, there is now a procedure for testing and maintaining the cleanliness of the room, as well as a standard method for efficient, large-scale wafer and chip testing at the Kansas State University facilities.